薄膜光学常数决定薄膜的光学性能。
The optical constants of thin film are decisive factors for its optical properties.
薄膜光学常数的大小和薄膜的表面形貌有关；
The thin film optical properties was correlative with thin film microstructure.
给出了确定透明均匀薄膜光学常数和厚度的方法。
A method for determining both the optical constants and the thickness of thin films from transmission spectrum has been presented.
薄膜光学所有的光学特性都是基于薄膜内光的干涉作用。
All the optical character of thin film is based on the interference of light inside.
推导中应用了薄膜光学的惯用概念，所得公式亦比较简洁。
The theory has been related to the familiar concepts of thin film optics, and simple results are obtained.
简要的叙述了光学薄膜光学特性的通用计算方法，即特征矩阵法。
A general calculating method of optical character of optical thin films, namely characteristic matrix method is stated concisely.
本文讨论了通过“多约束非线性方程组”解析真空紫外薄膜光学常数的方法。
This paper discusses the method of evaluating VUV optical constants of the thin films by the multi-restrained nonlinear equation group.
基于薄膜光学理论，对于不同的情况分别采用了两种多层膜结构作为初始膜堆。
Based on the optical thin-film theory, two multilayer structures are adopted as initial stacks in two conditions, respectively.
结合激光外差干涉法和透射式椭偏测量原理，研究了一种快速、高精度测量纳米厚度薄膜光学参数的方法。
Based on the optical heterodyne interferometer and transmission ellipsometry, a new fast measurement technique of nanometer film was presented computational.
在此基础上根据薄膜光学计算理论和最优化理论，提出了一种测量多层薄膜厚度的新的全局优化算法——GASA算法。
According to the theories of thin film calculation and optimization, a new global optimization method - GASA for multilayer film thickness calculation is presented in this paper.
结合激光外差干涉术和反射式椭偏测量技术，设计了一种抗干扰能力强，快速、高精度测量纳米厚度薄膜光学参数的方法。
Optical heterodyne interferometry together with reflective ellipsometry, a fast measurement technology with high anti-interference performance was applied to nanometer film.
从严格数值结果与近似公式的对比发现，对共振滤波器的旁带反射率，可以用普通薄膜光学的反射率公式进行非常直观方便的讨论。
Comparing rigorous numerical result with approximate formulae, we find that the reflectance formula of general thin optics can easy straight calculate the side bands reflectance of resonance filter.
从严格数值结果与近似公式的对比发现，对共振滤波器的旁带反射率，可以用普通薄膜光学的反射率公式进行非常直观方便的讨论。
Comparing rigorous numerical result with approximate formulae, we find that the reflectance formula of general thin optics can easy straight calculate the side bands reflectance of resonance filter.
应用推荐