• 俄歇电子谱仪广泛地利用来确定固体表面化学电子结构(40A)。

    Auger electron Spectrscopy (AES) has widespread use in determining the chemical and electronic structure of solid surface (40a).

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  • 给出了利用JAMP - 10型俄歇电子谱仪进行定量分析(包括深度定量分析)一些结果

    Some results of quantitative analysis, including depth quantitative analysis, on Model JAMP-10 Auger Electron Mieroprobc are given.

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  • 辉光放电光电子谱仪GDS成分检测结果表明表面含碳量可达29.8%,合金渗层含量梯度分布

    GDS testing results indicate the carbon content of the surface reaches 29.8%, the carbon content in the alloyed layer emerges in gradient distribution too.

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  • 电子寿命工作能区分42个

    The workable region for a spectrometer was divided into 42 small regions.

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  • 探测效率X射线电子谱仪一个很重要参数

    Detective efficiency is an important instrumental parameter of X ray photoelectron spectrometer.

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  • 谱仪系统三部分组成,电离主体充气系统电子系统。

    The system is composed of main body of the chamber, gas-filled and electronics system.

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  • 本文阐述了电子关键部件——电子能量分析器一种慢性故障现象(沾污)及其消除方法

    This paper presents a method to eliminate the chronic deterioration on the performance of electron energy analyser, which is a key component of the electron spectrometer.

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  • 运用能技术(EDXA)、X射线衍射XRD)、扫描电子显微镜SEM图像分析涂层成分显微组织、涂层相结构和组成进行了分析

    The coating composition, microstructure and phases were investigated by energy dispersive X ray analysis (EDXA), X ray diffraction(XRD), scanning electron microscope(SEM)and image analyzer.

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  • 报道了我们自行搭建扫描探针电子数据获取系统物理实现

    The physical frame of a home-made data acquisition system of the scanning probe electron energy spectrometer (SPEES) was reported.

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  • 扫描电子显微镜(sem)X射线电子谱仪(XPS)对钢球磨损表面进行了分析。

    The worn surfaces of the steel balls were analyzed by scanning electron microscopy (SEM) and X-ray photoelectron spectroscopy (XPS).

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  • 报道了扫描探针电子SPEES)中俄电子出射理论模拟研究。

    The simulation of the Auger electron emissions in scanning probe electron energy spectrometer (SPEES) is reported.

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  • 利用透射电子显微镜X射线衍射扫描电子显微镜和X射线能量色散谱仪分析多层微结构

    The microstructure of multilayers was characterized by high-resolution transmission electron microscopy, X-ray diffraction, scanning electron microscope and energy dispersive spectrometer.

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  • 本文对数控车削刀具沟槽磨损问题,应用扫描电镜、电子探针、俄歇等进行了探讨

    Using electronic sweep mirror, electronic prober and energy spectrum meter to investigate the groove shape wear of a cutting tool, while numerical controlled turning the pure nickle.

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  • 计算表明:应用渡越光栅谱仪选择合适膜片厚度间距对于给定电子可以得到能量接受度好的能量分辨率

    Calculation shows that large energy acceptance with good resolution can be achieved for given electron spectrum by proper selection of foil thickness and spacing when using TRG spectrometer.

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  • 实验操作者角度微波电子自旋共振谱仪原理实验现象进行分析

    This article analyses the principle and experiment phenomenon of microwave ESR spectrometer from an experiment operator's standpoint.

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  • 扫描电子显微镜和铜以及不锈钢热等静压焊接试样的焊接界面进行了分析研究

    The SEM and EDS were used in this paper to analysis the welding interface of the specimens of tungsten and copper, copper and stainless steel made by HIP welding.

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  • 建立一种带有谱仪扫描电子显微镜(SEM -EDXA)测定麦草细胞壁分布方法。讨论了溴化、切片厚度和样品座对定量测定的影响。

    A method has been developed for the determination of lignin distribution in wheat straw cell walls by scanning electron microscopy coupled with energy dispersive X-ray analysis (SEM-EDXA) technique.

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  • 采用扫描电子显微镜(sem)、X射线电子谱仪(XPS)、傅立叶红外谱仪(IR)对盘上磨进行表面分析。

    The surface of the wear scar was analyzed by scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS) and Fourier infrared spectroscopy (IR).

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  • 报道了利用红外吸收X射线电子表面张力测试新型半导体清洗工艺进行研究的结果。

    A new type technique of semiconductor cleaning is studied via infrared absorption spectra, X ray photoelectron spectra and surface tension detector.

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  • 介绍用于原子分子实验的能量损失符合谱仪前端电子数据获取系统

    This paper describes the front-end electronics and data acquisition (DAQ) system used in electron Energy Loss Coincident Spectrometer (EELCS).

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  • X射线衍射检测了样品结构测量了样品的阻抗电子磁共振

    The structures of the samples were analyzed by X-ray diffraction, and the impedance spectra and electron paramagnetic resonance spectra were measured.

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  • 本文应用XPSX射线电子谱仪研究了真空烘烤对碘化铯光阴极化学状态影响

    The effects of vacuum-baking on the chemical state of CsI photocathodes are studied with X-ray photoelectron spectroscopy (XPS).

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  • X射线光电子谱仪(XPS)研究了仿制红袖着色机理

    The colour mechanism of imitated copper-red glaze was studied under the use of XPS.

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  • 使用X射线电子谱仪(XPS)、X射线衍射(XRD)、原子显微镜(afm)对薄膜结构进行了分析。

    The structural properties of the films were analyzed by X ray photo electron spectroscopy (XPS), X ray diffractometer (XRD) and atomic force microscope (AFM).

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  • 解决发电机定子线圈异常升温现象,利用扫描电子显微镜、等现代分析手段300MW发电机定冷水系统不明异物进行了表征分析。

    To solve the problem of abnormal temperature rise of generator stator slots, unknown foreign powder in the 300MW generator stator water cooling system was characterized and analyzed by SEM and EDS.

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  • 光学、扫描电子显微镜透射电子显微镜观察揭示出生理优势,并用颗粒污泥元素组成进行了分析。

    From observation of light microscope, SEM and TEM revealed the predominant bacteria of various groups, and element composition of granular sludge was analysed by EDXA.

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  • 研制了超热电子谱仪介绍谱仪工作原理设计思想结构主要技术指标

    The hot electron magnetic spectrometer was developed and its principle, (designing) idea, structure and index were introduced.

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  • PHI 550俄歇电子谱仪测出上述样品中银浓度剖面分布

    After that the above samples have been analysed by AES (type PHI 550) and silver concentration profiles in the gold films have been obtained.

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  • 综述了金属栅网电子减速透镜分析器中的应用

    The metal mesh used in retarding lenses and analyzer of electron spectrometer is summarized, Thedesign of retarding lenses can be simp1ified, when Enzel lenses is combined with the metal mesh.

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  • 综述了金属栅网电子减速透镜分析器中的应用

    The metal mesh used in retarding lenses and analyzer of electron spectrometer is summarized, Thedesign of retarding lenses can be simp1ified, when Enzel lenses is combined with the metal mesh.

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