通过对MOS电容进行热载子注入和总剂量辐照实验，探讨了MOS结构热载子注入与总剂量辐射响应的相关性。

By comparing the MOS structure's responses to hot-carrier injection and total dose radiation, the correlation between them is investigated.

youdao

通过对MOS电容进行热载子注入和总剂量辐照实验，探讨了MOS结构热载子注入与总剂量辐射响应的相关性。

By comparing the MOS structure's responses to hot-carrier injection and total dose radiation, the correlation between them is investigated.

youdao