阐述了影响CCD探测灵敏度的暗电流及暗电流噪声的产生机理，分析了其对CCD性能的影响。
The dark current that affects CCD detection sensitivity is described. The generating mechanism of dark current noise and its influence on CCD performance are analyzed.
同时，采用了较为精确的过剩噪声系数表达式，给出了灵敏度与暗电流的关系曲线。
In the meanwhile, with using more accurate expression of the avalanche excess noise factor, we give a relation schema between sensitivity and dark current.
通过实验探讨了APD的温度特性，得到了APD的雪崩电压、暗电流、光电流、等效噪声功率与温度的关系。
Experiments were done to probe into the characteristics of APD. The relationships between avalanche voltage, dark current, photocurrent, NEP and temperature were educed separately.
该器件可以有效提高器件光电转换增 益，限制器件的暗电流，降低器件噪声，得到高的信噪比。
The device can effectively improve photoelectric conversion gain of devices, limit the dark current of devices, and reduce the noise of devices, so as to obtain higher signal-to-noise.
该器件可以有效提高器件光电转换增 益，限制器件的暗电流，降低器件噪声，得到高的信噪比。
The device can effectively improve photoelectric conversion gain of devices, limit the dark current of devices, and reduce the noise of devices, so as to obtain higher signal-to-noise.
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