文中首先分析了时序元件的不可测因素，提出了扫描设计前增加测试逻辑的设计方法。

In This paper, based on analysis of the untested factors of the sequence cell, presents a design method, which the test logic inserted, before the scan design.

youdao

文中首先分析了时序元件的不可测因素，提出了扫描设计前增加测试逻辑的设计方法。

In This paper, based on analysis of the untested factors of the sequence cell, presents a design method, which the test logic inserted, before the scan design.

youdao