本文主要是对大规模、超大规模集成电路寄存器传输级（RTL）的自动测试产生算法进行研究。
This dissertation focuses on automatic test generation (ATPG) algorithms for very large-scale integrated circuits at register-transfer-level (RTL).
为了降低开发超大规模集成电路器件的测试程序的费用，缩短开发周期，给出了一种设计和开发测试系统仿真器的基本思想、结构组成及其功能。
In order to reduce the cost of developing VLSI test program and shorten developing cycle, an idea of a simulator design of test system and gives the simulators structure and function is put up.
下一代的大规模集成电路的测试探头要求使用在铝电极上的低接触力的联接方法。
The contact method with low contact force on Al electrodes is required for test probing of LSI for the next generation.
集成电路测试是保证产品质量的重要手段，如何检测MCU类复杂大规模集成电路是测试的难点。
IC test is the most important method to ensure the product quality. It is a difficult problem to test the complicated VLSI such as MCU.
集成电路测试是保证产品质量的重要手段，如何检测MCU类复杂大规模集成电路是测试的难点。
IC test is the most important method to ensure the product quality. It is a difficult problem to test the complicated VLSI such as MCU.
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