“全自动纳米多孔氧化硅薄膜折射率和厚度测定系统”采用的测量方法是光的反射法，在选用氦氖激光作为、入射光源时，考虑到氦氖激光的单色性不会因为经过分束镜后发生变化；
The automatic system of measurement of the refractive index & thickness of NMSTF applies the reflection method to measure the parameters with the helium-neon laser as the incident light source.
“全自动纳米多孔氧化硅薄膜折射率和厚度测定系统”采用的测量方法是光的反射法，在选用氦氖激光作为、入射光源时，考虑到氦氖激光的单色性不会因为经过分束镜后发生变化；
The automatic system of measurement of the refractive index & thickness of NMSTF applies the reflection method to measure the parameters with the helium-neon laser as the incident light source.
应用推荐