本论文是以光学扫瞄系统为基础，针对矽晶片内部的结构成像设计出有效方便的架构。
The purpose of this thesis is based on optical scanning systems to probe the inner structures of silicon IC chips by compendious and valid methods.
本实习目的，让学生利用光学显微镜及扫瞄式电子显微镜认识基本之螨蜱外部形态构造及功能，与观察螨类对重要经济作物的为害特徵。
This course offers a basic understanding on morphology structure and function, the injury on crop of Acari by light microscopy and scanning electron microscopy practical operation.
本实习目的，让学生利用光学显微镜及扫瞄式电子显微镜认识基本之螨蜱外部形态构造及功能，与观察螨类对重要经济作物的为害特徵。
This course offers a basic understanding on morphology structure and function, the injury on crop of Acari by light microscopy and scanning electron microscopy practical operation.
应用推荐