Some double crystal rocking curves of photocathode epitaxy materials and substrates are measured by means of X-ray double crystal diffraction in the bonding process.
用X射线双晶衍射仪测量了阴极和玻璃热粘结工艺过程中阴极材料外延层和衬底的双晶回摆曲线。
Other informations obtained from the X-ray double-crystal diffraction rocking curves are also discussed.
并对X射线双晶给出的其他信息做了必要的讨论。
The double crystal X-ray diffraction rocking curves analysis was used to determine the lattice constants of the proton-exchanged (PE) and annealed proton-exchanged (APE) 1ayer.
用双晶X射线测量质子交换（PE）和退火质子交换（APE）波导层晶格常数的变化。
The double crystal X-ray diffraction rocking curves analysis was used to determine the lattice constants of the proton-exchanged (PE) and annealed proton-exchanged (APE) 1ayer.
用双晶X射线测量质子交换（PE）和退火质子交换（APE）波导层晶格常数的变化。
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