只有对非常高通量的反应堆，才可能应用高角分辨率的衍射计。
Only with very high - flux reactors is it usually possible to employ diffractometers of high angular resolution.
利用显微硬度计、金相显微镜和X射线衍射仪测定了渗氮层的硬度梯度、层深、显微组织和相组成。
The hardness gradient, depth, microstructure and phases of nitrided layers were measured with Microhardness Apparatus, Microcopy and X-ray diffractometer.
利用光学金相显微镜、显微硬度计、电子探针及X射线衍射分析仪初步探索其中温回火转变过程。
Optical metallographic microscope, micro-hardness tester, electron microprobe and X-ray diffraction analysis were applied to explore the process of intermediate temperature tempering transformation.
利用光学显微镜、扫描电镜、显微硬度计及X射线衍射仪分析了高氮奥氏体的等温分解过程。
Employed by optical microscope, scanning electron microscope, microhardness tester and X ray diffraction instrument, the isothermal decomposition process of high nitrogen austenite was investigated.
采用X -射线衍射、差热分析、微量热计及压汞测孔仪对公路粉煤灰水泥的水化产物、水化放热曲线、孔尺寸分布进行了研究。
The hydrated products and pore size distribution of high road fly ash cements were studied by means of XRD, DTA, Mercury porosimeter, etc.
利用X射线衍射仪、扫描电子显微镜和荧光分光光度计对样品的晶体结构和光学性质进行了分析。
The structural and optical characteristics were studied by X-ray diffraction, scanning electron microscopy and Photoluminescence spectrum.
本文给出了辐射计的衍射损失，黑度修正及反射率修正，实际测量结果比计算结果大0.19%。
The diffraction loss, blackness correction and reflectance correction of the radiometer are given in this paper. The measurement result is 0 19% larger than the calculated result.
利用X射线衍射、扫描电子显微镜和分光光度计对制备的V2O5薄膜的结构、形貌和光学特性进行研究。
The microstructure, the morphology and optical properties of V2O5 thin films were studied by XRD, SEM and spectrophotometer.
采用中频真空感应熔炼炉、X射线衍射仪、金相显微镜、电子探针、显微硬度计等实验分析方法，研究了稀土金属铈与低熔点金属锡在钢中的相互作用。
The interaction between the cerium and tin in steel was studied by vacuum induction melting, Xray diffraction, optical microscopy, electronic probe microscopy analysis, and microhardness tester.
利用X射线衍射仪和示差扫描量热计（DSC），研究该非晶薄带的非晶特性及晶化过程；
The amorphous ribbons and their crystallization processes were identified by differential scanning calorimeter (DSC) and X-ray diffraction (XRD).
本文分别用原子力显微镜、双束紫外可见分光光度计、X-衍射仪等表征了用以上两种方法制备的三氧化钨薄膜。
The tungsten oxide films by two methods were characterized by atomic force microscope, double-beam UV-VIS-NIR spectrophotometer and X-diffractometer.
本文分别用原子力显微镜、双束紫外可见分光光度计、X-衍射仪等表征了用以上两种方法制备的三氧化钨薄膜。
The tungsten oxide films by two methods were characterized by atomic force microscope, double-beam UV-VIS-NIR spectrophotometer and X-diffractometer.
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