The microstructure evolution along the cross section of the dissimilar joint was analyzed with the scanning electron microscopy (SEM) and X-ray energy dispersive spectroscopy (XEDS) method.
采用扫描电镜(sem)及能谱分析(XEDS)等方法对接头横截面的微观组织进行分析。
The microstructure evolution along the cross section of the dissimilar joint was analyzed with the scanning electron microscopy (SEM) and X-ray energy dispersive spectroscopy (XEDS) method.
采用扫描电镜(sem)及能谱分析(XEDS)等方法对接头横截面的微观组织进行分析。
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