Error effect in depth of diffraction pattern of X ray reflection zone plate has been studied.
研究x射线反射式波带片衍射图形制造过程中的深度误差效应。
Total reflection X ray fluorescence (TXRF) method was used to the multielement analysis of Jiangxi Wuyuan green tea and Ninghong black tea.
用全反射X -射线荧光法（TXRF）分析了江西婺绿和宁红茶的矿质元素含量。
The sensitivity of total reflection X ray fluorescence analysis (TXRF) is higher than normal X ray fluorescence analysis (XRF).
全反射荧光分析(TXRF)比常规荧光分析(XRF)具有更高的灵敏度。
The advances, principles, Instruments and applications of total reflection X-ray fluorescence spectrometry are reviewed with 67 references.
本文综述全反射x -射线荧光光谱分析的进展、原理、仪器和应用。参考文献67篇。
The experimental instrument, sample preparation and determination method of the trace element Se in solution by total reflection X-ray fluorescence analysis are described in this paper.
本文叙述了用全反射X荧光分析方法测定溶液中微量硒的实验装置、制样技术和测定方法。
X-ray diffraction pattern features strong reflection on the odd basement layers and weak one on the even basement layers.
射线衍射谱的特征是基底奇数层反射强，而偶数层反射不明显。
X-ray diffraction pattern features strong reflection on the odd basement layers and weak one on the even basement layers.
射线衍射谱的特征是基底奇数层反射强，而偶数层反射不明显。
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