During the testing of the integrated circuit (404), it communicates in the wafer test mode.

在集成电路(404)的测试过程中，它在晶片测试模式下通信。

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Test wafer - a silicon wafer that is used in manufacturing for monitoring and testing purposes.

测试晶圆片駦-用于生产中监测和测试的晶圆片。

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Finally, this paper primarily establishes a testing method of characterization silicon carbide wafer quality.

最后，初步确立了表征碳化硅单晶抛光片质量的测试方法。

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Finally, this paper primarily establishes a testing method of characterization silicon carbide wafer quality.

最后，初步确立了表征碳化硅单晶抛光片质量的测试方法。

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