The VLSI testing is being pushed to the high-level based technology.
VLSI集成电路芯片测试技术正在向高层次测试推进。
Two main aspects in VLSI testing, fault simulation and test generation, are researched in this dissertation.
本文对VLSI测试中的两个主要问题—故障模拟和测试产生进行了深入的分析和研究。
Developing flow of very large scale integrated (VLSI) circuits is divided into four main steps: designing, manufacturing, testing and packaging.
超大规模集成(VLSI)电路产品的开发流程主要包括设计、制造、测试和封装四个步骤。
Testing is an important process for industrial production of VLSI chips, the goal of which is to detect circuit faults caused by manufacturing process.
测试是芯片产品规模化生产的重要环节，其目标是检测制造工艺过程引起的电路故障。
Testing is an important process for industrial production of VLSI chips, the goal of which is to detect circuit faults caused by manufacturing process.
测试是芯片产品规模化生产的重要环节，其目标是检测制造工艺过程引起的电路故障。
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