Radiation effects in si ICs, such as total dose effect, single event effect, et al., can be utilized to measure space radiation environment.
空间辐射环境能够引起半导体集成电路发生的总剂量效应、单粒子效应等辐射效应，可以被用来进行空间辐射环境监测。
A pulsed total dose effect in-circuit test system based on PCI card virtual instrument was developed. Working principle and technical specifications were introduced in detail.
建立了基于PCI插卡式虚拟仪器的脉冲总剂量效应在线测试系统，详细说明了其工作原理和技术指标。
A pulsed total dose effect in-circuit test system based on PCI card virtual instrument was developed. Working principle and technical specifications were introduced in detail.
建立了基于PCI插卡式虚拟仪器的脉冲总剂量效应在线测试系统，详细说明了其工作原理和技术指标。
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