To reduce the storage volume of the test data during the built-in self-test (BIST), a new BIST technique based on two dimensional compression of test data is presented.
为压缩内建自测试(BIST)期间所需测试数据存储容量，提出了一种新的基于测试数据两维压缩的BIST方案。
In order to reduce the volume of IC test data, an index coding compression scheme based on test data partition merging is proposed.
为降低集成电路的测试数据量，提出一种分组合并的索引编码压缩方案。
In order to reduce the volume of IC test data, an index coding compression scheme based on test data partition merging is proposed.
为降低集成电路的测试数据量，提出一种分组合并的索引编码压缩方案。
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