A new BIST structure with the method of test vector generation based on a controlled LFSR is proposed.
本文提出了一种基于受控线性反馈移位寄存器（LFSR）进行内建自测试的结构及其测试矢量生成方法。
This paper studies a test vector generation algorithm for digital circuits which can locate the component faults.
结合一个实际电路，研究了一种可把数字电路故障定位到器件级的测试向量生成算法。
The algorithm maps test vector space to the chaotic space and USES chaotic search to find out the suitable testing pairs.
该算法将测试向量空间映射到混沌空间并采用混沌搜索来寻找一对符合要求的测试向量对。
This paper introduces the special software and flow converted from VCD test vector to STIL test vector, which is based of SAPPHIRE SOC test System.
本文基于SAPPHIRE集成电路测试系统，介绍了自行开发的从VCD测试向量到STIL测试向量的转换软件及流程。
Circuits described are modeled to behavior sets after abstraction, and can be replaced by their behavior sets during functional test vector generation procedures.
通过抽象，电路可以规范为行为集，并代替电路本身进行功能测试向量的生成。
The test vectors of some sub-scan chains generate by controllable LFSR when these chains only need to update test vector and do not need to shift out test responses.
当某个子扫描链的测试向量需要更新且又不需要移出其测试响应时，其测试向量由可控LFSR产生。
During the period of employing IEEE1445 to resolve the problem of fault diagnose, the test vector set's reduction is a hard problem to the entire developing process.
在利用IEEE1445标准来完成电路板的故障诊断时，矢量的约简是整个测试程序开发过程中的一个难点。
To satisfy specialized demands of test vector in digital circuit simulation and fault diagnosis, we develop a software package"Dragging Mouse to Generate Test Vector"by VB5.0.
针对数字系统仿真、故障诊断中对测试向量的特殊要求，利用VB 5 0开发出了拖拽鼠标快速生成测试向量的软件包。
The fault simulator is an important part of a simulating based automatic test generating system, and its performance greatly affects the quality of the gained test vector set.
故障模拟器是基于模拟算法的测试生成系统的重要组成部分，其性能优劣直接影响测试集的各项指标。
This article gives a new BIST test generator design for transient current testing, this design not only produces needed test vector pairs but also has an advantage of low hardware overheads.
本文给出了一种新型的瞬态电流测试BIST测试生成器设计方案，该设计可以产生所需要的测试向量对，同时具有硬件开销小的优点。
This article gives a new BIST test generator design for transient current testing, this design not only produces needed test vector pairs but also has an advantage of low hardware overheads.
本文给出了一种新型的瞬态电流测试BIST测试生成器设计方案，该设计可以产生所需要的测试向量对，同时具有硬件开销小的优点。
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