The photographs of the sweep electron microscope show that fatigue damage are caused mainly by microcracks and impurities of metal.
通过疲劳断口的电镜扫描试验，证明防爆膜的疲劳破坏是由存在于金属内部的微裂纹和杂质所引起。
The photographs of the sweep electron microscope show that fatigue damage are caused mainly by microcracks and impurities of metal.
通过疲劳断口的电镜扫描试验，证明防爆膜的疲劳破坏是由存在于金属内部的微裂纹和杂质所引起。
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