The depth of cracks on the silicon sample subsurface corroded was measured by a scanning electron microscope.
用扫描电子显微镜观察和测量腐蚀后硅样品的亚表面裂纹。
Combination of these logs, supported by plotted sample description, are used in establishing precise subsurface stratigraphic correlations.
现在综合应用这些测井方法，再结合岩样描述，进行精确的地下地层对比。
Combination of these logs, supported by plotted sample description, are used in establishing precise subsurface stratigraphic correlations.
现在综合应用这些测井方法，再结合岩样描述，进行精确的地下地层对比。
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