This paper presents a method to solve reliability evaluation problem of electronic equipments with high reliability and long life using double crossed step-stress testing in Normal distribution.
首先针对高可靠、长寿命电子装备的可靠性评估问题，提出一种新的试验方法——双应力交叉步阶试验。
This paper presents a method to solve reliability evaluation problem of electronic equipments with high reliability and long life using double crossed step-stress testing in Normal distribution.
首先针对高可靠、长寿命电子装备的可靠性评估问题，提出一种新的试验方法——双应力交叉步阶试验。
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