The thicknesses of the thin films are measured by spectroscopic ellipsometer.
用光谱式椭偏仪对薄膜的厚度进行了测试。
A new type of infrared spectroscopic ellipsometer has been designed and constructed.
介绍一种新型红外椭圆偏振光谱实验系统。
A new type of infrared spectroscopic ellipsometer has been designed and constructed.
介绍一种新型红外椭圆偏振光谱实验系统。
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