• The researchers analysed the sizes and structures of ash particles using a variety of techniques, such as atomic force microscopy, scanning electron microscopy and X-ray diffraction.

    研究人员使用不同的技术研究了火山灰颗粒的尺寸和结构,例如原子力显微镜、电子扫描显微镜和X射线衍射。

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  • The scanning machines, called "backscatter scanners," deliver a dose of ionizing radiation equivalent to 1 percent or less of the radiation in a dental X-ray.

    扫描机,所谓的“反射散射扫描仪”,发射出的电离辐射剂量相当于牙科辐射X射线的1%或更少。

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  • One major advantage with technology like Korset in addressing all that, he said, is that it doesn't rely on the airline terminal X-ray scanning approach to spotting such malware.

    像Korset这类技术的一个主要优势在于它处理一切,而不是凭借像航空公司终端X射线扫描那样的方法来发现恶意软件。

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  • But the most reliable alternative to X-ray scanning, hand-searching everything, is slow and expensive.

    但是手动搜索一切,这种替代X射线扫描的最可靠的办法慢而昂贵。

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  • Methods The pig experimental models of pulmonary embolism and infarction were examined by X ray, ventilation perfusion scanning, helical CT, angiography.

    方法以小型猪为肺栓塞、肺梗死实验动物模型,进行X线平片、核素灌注扫描、螺旋CT、血管造影检查。

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  • The scanning electron microscope provides information on chemical composition by use of X-ray spectrometer attachments.

    扫描电子显微镜能利用x射线谱仪的附件来提供化学组份的信息。

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  • These should be very useful to the soft X ray contact microscopy in air and the soft X ray scanning transmission microscopy.

    这些结果将十分有益于大气环境下的软X射线接触显微术及软X射线扫描透射显微术的研究。

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  • X ray diffraction (XRD), scanning electron microscopy (SEM), high resolution transmission electron microscopy (HRTEM), and photoluminescence (PL) are used to analyze the synthesized GaN nanorods.

    用X射线衍射(XRD)、扫描电镜(SEM)、高分辨率透射电镜(HRTEM)和光致发光光谱(PL)对生成的产物进行了分析。

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  • However under the unconventional CT scanning mode, using the low-energy X-ray source, which can save the energy, can fulfill the CT reconfiguration of the specimens with the flat-type.

    但在非常规的CT扫描方式下能用低能的X射线源完成这些形如扁平体试件的CT重构,节省了能量。

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  • Scanning electron microscope (SEM) and X-ray diffraction (XRD) were used to measure the surface morphology, the crystal microstructure and the distribution of diamond grain in the film.

    用扫描电镜(sem)和X射线衍射(XRD)方法检测了复合膜的表面形貌、晶体显微结构和复合膜中金刚石颗粒的分布情况。

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  • The morphology and crystal structure of solvent induced crystalline PET were studied by X-ray diffraction and scanning electron microscope.

    应用X射线衍射和扫描电子显微镜研究了溶剂诱导结晶PET的形态和结晶结构。

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  • The worn surfaces of the steel balls were analyzed by scanning electron microscopy (SEM) and X-ray photoelectron spectroscopy (XPS).

    用扫描电子显微镜(sem)和X射线光电子能谱仪(XPS)对钢球磨损表面进行了分析。

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  • By using visual examination, scanning electronic microscope, X-ray energy spectrum and metallurgy and chemical analysis, the cause of crack occurred in bellow expansion joint was analyzed.

    采用宏观检查、扫描电镜、X射线能谱、金相分析及化学分析等方法,对金属波纹膨胀节开裂的原因进行了分析。

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  • The crystalline morphology and lattice constants of silica bricks in several status were investigated by the optic microscope, scanning electron microscope and X-ray diffraction.

    利用光学显微镜、扫描电镜和X射线衍射仪研究了几种不同状态硅砖的晶体形貌和晶格常数。

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  • The crystallization and microstructure of the glass were investigated using scanning electron microscopy and X-ray diffraction technique.

    用扫描电子显微镜和X射线衍射技术分析了微晶玻璃析晶和显微特征。

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  • The phase structure and microstructure of samples under different heating rates were investigated by X-ray diffraction (XRD) and scanning electron microscope (SEM) etc.

    用X射线衍射仪(XRD)以及扫描电镜(SEM)等研究了试样在不同预设升温速度下的相结构和显微组织。

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  • The surface morphology and characteristics of the films were characterized by scanning electron microscopy (SEM), X-ray diffraction (XRD), and atomic force microscopy (AFM).

    该薄膜的表面形态和特征采用扫描电子显微技术(SEM),X射线衍射(XRD)以及原子力显微技术(afm)描述。

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  • The products were well-characterized by X-ray diffractometer (XRD) and scanning electron microscope (SEM).

    所得产物用X射线衍射仪(XRD)和扫描电子显微镜(SEM)进行了表征。

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  • The structures and surface morphology of coating and oxide film were characterized using X-ray diffraction and scanning electron microscopy.

    利用X射线衍射和扫描电镜研究涂层和氧化物膜的结构和表面微观形貌。

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  • The constituents and the structures of the diamond films have been identified by means of scanning electron microscopy (SEM), Raman spectroscopy and X-ray diffraction.

    利用扫描电子显微镜(SEM )、显微喇曼光谱、X射线衍射等手段对合成的金刚石薄膜的成分与结构进行了分析。

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  • The hydration properties of limestone powder in a complex binder system were studied by using scanning electron microscopy, X-ray diffraction and energy dispersive spectrometer.

    用扫描电镜、X射线衍射和能谱技术研究石灰石粉在复合胶凝材料中的水化性能和水化产物。

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  • The prepared product has been characterized by means of X-ray diffraction (XRD) and scanning electron micrography (SEM).

    通过X射线粉末衍射(XRD)和扫描电子显微镜(SEM)对产物进行了表征。

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  • In this paper, Korean pine carbonization samples were analyzed at different heating temperatures by scanning electron microscope (SEM) and X-ray energy dispersive analysis (EDS).

    对模拟火灾不同受热温度条件下的炭化红松样品,进行了扫描电镜(sem)和x -射线能谱仪(EDS)分析。

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  • The microstructure of multilayers was characterized by high-resolution transmission electron microscopy, X-ray diffraction, scanning electron microscope and energy dispersive spectrometer.

    利用透射电子显微镜、X射线衍射仪、扫描电子显微镜和X射线能量色散谱仪分析了多层膜的微结构。

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  • Optical coupling and transmission performing with optic fiber and fiber optic face plate, a new sector beam linear array scanning X-ray detector technique based on plane array CCD devices is proposed.

    提出了一种基于面阵CCD器件,采用光纤和光纤面板进行光耦合及传输的扇形束线阵扫描X射线新型探测器技术。

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  • The X ray diffraction and scanning electron microscope analyses show that the product possesses crystal structure, and the crystallized grain is rectangular and fusiform.

    射线衍射和电镜扫描分析表明碳酸稀土产品属晶型结构,为长方体和纺锤形状结晶。

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  • The structure, surface morphology and the optical properties were characterized by x-ray diffraction (XRD), scanning electron microscopy (SEM) and photoluminescence (PL).

    用X 射线衍射(XRD)、扫描电镜(SEM)、荧光光谱(PL)对样品进行结构、形貌和发光特性的分析。

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  • The microstructure? Element distribution and phase after hot-corrosion were analysed by means of X-ray diffraction (XRD) and scanning electron microscope (SEM).

    利用X射线衍射(XRD)和扫描电镜(sem)等手段,对高温熔盐热腐蚀后的组织形貌、元素分布及物相进行了分析。

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  • Reduced products are analysed by scanning electron microscopy and X-ray diffraction.

    采用扫描电镜及X -射线衍射对还原产品进行了分析。

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  • Reduced products are analysed by scanning electron microscopy and X-ray diffraction.

    采用扫描电镜及X -射线衍射对还原产品进行了分析。

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