Atomic force microscopy generates very high-resolution images (about 5-nanometer resolution) by “feeling” the surface of a sample with a tiny probe tip.
原子力显微镜是运用一种微小的探针去“感受”样本表面，能得到高分辨率的影像（约5纳米的分辨率）。
Scanning tunneling microscope (STM) work by the voltage added to the microscope probe tip and the ends of the scanned object and then detect current changes.
扫描隧道显微镜(STM)的工作方式是把电压加到显微镜探头尖端与被扫描物体这两端，然后检测电流变化。
The present invention is directed to a test probe having an indexable probe tip.
本发明涉及具有可标引的探针针尖的测试探针。
Optical fiber carries excitation light produced by the blue LED to the thin-film coating at the probe tip.
光纤把LED产生的励磁光传输给探测器尖端的薄膜涂层。
In one embodiment, an insulative sleeve extends from the test probe and surrounds a portion of the exposed probe tip.
在一个实施例中，绝缘套筒从测试探针延伸，并且围绕暴露的探针针尖的一部分。
The insulative sleeve is moveable relative to the probe tip and may be indexable to at least two positions.
绝缘套筒相对于探针针尖可移动，并且可以标引至少两个位置。
We show the physical pictures about the interaction between the probe tip and sample and photon tunneling effect in PSTM.
给出了PSTM中探针针尖与样品相互作用和光子隧穿的物理图像。
A delicate probe tip to provide the quickest response with minimal impact on the product. Ideal for small products and semi-solid products.
纤细的探头尖部可提供更快的反应时间和对产品最小的冲击。
A delicate probe tip to provide the quickest response with minimal impact on the product. Ideal for small products and semi-solid products.
纤细的探头尖部可提供更快的反应时间和对产品最小的冲击。
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