The microscopic mechanism of irradiation damage of Al film reflector is studied by the slow positron annihilation technique and X-ray diffraction.
用慢正电子湮没等分析技术研究了辐照损伤的微观机制。
The microscopic mechanism of irradiation damage of Al film reflector is studied by the slow positron annihilation technique and X-ray diffraction.
用慢正电子湮没等分析技术研究了辐照损伤的微观机制。
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