The invention overcomes the defects that the existing photoanode electron transmission resistance test requires large-scale test instruments and strict experiment environment.
本发明克服了现有光阳极电子传输阻抗测试需要大型测试仪器和严格实验环境的弊端。
The invention overcomes the defects that the existing photoanode electron transmission resistance test requires large-scale test instruments and strict experiment environment.
本发明克服了现有光阳极电子传输阻抗测试需要大型测试仪器和严格实验环境的弊端。
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