Phase difference amplification (PDA) was proposed as a means of improving phase resolution and accuracy in interferometric measurement.
相位差放大技术(PDA)是干涉测量领域里一种提高相位分辨率和测量精度的手段。
Being of the phase resolution power of nm level, the DIC microscopy can discern the microcosmic structure which cannot be observed by the ordinary microscopy.
微分干涉相衬显微镜具有纳米级的相位分辨率，可以看到一般光学显微镜难以观察到的微细结构。
Being of the phase resolution power of nm level, the DIC microscopy can discern the microcosmic structure which cannot be observed by the ordinary microscopy.
微分干涉相衬显微镜具有纳米级的相位分辨率，可以看到一般光学显微镜难以观察到的微细结构。
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