The integrated circuits parametric yield is important problem of the IC designing and manufacture engineering.
集成电路参数成品率的研究是集成电路可制造性工程和设计研究的重要内容之一。
The maximum problem of parametric yield in VLSI is always an important issue in design for manufacturing (DFM).
超大规模集成电路(VLSI)中的参数成品率最优化问题一直是集成电路可制造性设计的重点研究问题。
These platforms work together to characterize, model and analyze the impact of variability on parametric yield and performance.
这些平台共同工作以表征、建模和分析变化的参数成品率和性能的影响。
Topics include the use of experimental design and response surface modeling to understand manufacturing process physics, as well as defect and parametric yield modeling and optimization.
主题包括使用实验设计和响应曲面造型，了解制造过程的物理，以及缺陷和产量建模和参数优化。
Topics include the use of experimental design and response surface modeling to understand manufacturing process physics, as well as defect and parametric yield modeling and optimization.
主题包括使用实验设计和响应曲面造型，了解制造过程的物理，以及缺陷和产量建模和参数优化。
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