The atmosphere attenuation to 650 nm light and the dot whipping caused by air turbulence were analyzed. The signal transmission waveform and communication eye diagram of the system were recorded.
分析了大气对光信号的衰减以及大气湍流造成的光斑抖动对通信的影响，记录了系统的信号传输波形和通信眼图。
The power of a light microscope is limited by the wavelength of visible light, which is about 500 nm.
光学显微镜的放大倍数受限于可见光的波长，大约500纳米。
For example, if pure white light hits an apple, all colors (wavelengths of light) are absorbed except for red (700-630 nm).
举例来说，纯粹的白光照射苹果，除红色外(波长700- 630纳米)所有的颜色(所有波长)的光都会被吸收。
Based on plenty of experiment data and analyzing results, we made several one-dimensional photonic crystals used in visible light and near infrared light which have band gaps from ten to a hundred nm.
根据大量的实验数据和分析结果，我们镀制出可见光区和近红外区的一维光子晶体，禁带分别有几十到一百纳米。
SpEctrum: ComplEtE rangE of colours within thE visiblE light, I. E. bEtwEEn thE wavElEngth of 400 nm to 700nm.
光谱：可见光内的全部色光系列。即光波在400至700纳米之间的排列。
Spectrum Complete range of colours within the visible light, I. E. Between the wave-length of 400 nm to 700nm.
可见光内的全部色光系列。即光波在400至700纳米之间的排列。
The CCD image sensor efficiently detects light emitted from the scintillator since it has high sensitivity to scintillator emission wavelengths (near 550 nm).
由于这些CCD图像传感器对闪烁体发光(波长约为550nm)具有较高的灵敏度，因此可以有效地探测到由闪烁体发出的光。
Brightness: (1) Measure of a paper's reflectance with a blue light of wavelength 457 nm.
亮度：(1)用波长457微米的蓝光量度纸张的反光强度。
However, resolution of a traditional wide-field optical microscopy is limited to about 230 nm laterally and 1000 nm axially, due to the diffraction-limit of light.
但由于衍射极限的存在，使传统的宽场光学显微镜横向和纵向的分辨率分别仅约为230nm和1000 nm。
After irradiated by ultraviolet (UV) light with a deuterium lamp for 5 h, the thickness of film decreases largely by 55%, and the refractive index of film changes from 1.484 to 1.445 at 550 nm.
经过紫外氘灯光源照射5个小时之后，薄膜厚度减少了55%，而折射率从1.484减小为1.445，光学厚度更是随着照射时间增长呈现出指数变化。
After irradiated by ultraviolet (UV) light with a deuterium lamp for 5 h, the thickness of film decreases largely by 55%, and the refractive index of film changes from 1.484 to 1.445 at 550 nm.
经过紫外氘灯光源照射5个小时之后，薄膜厚度减少了55%，而折射率从1.484减小为1.445，光学厚度更是随着照射时间增长呈现出指数变化。
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