PIN Diode switch is a kind of widely used microwave semiconductor control device. High frequency, broadband, multi through switch are the places where design difficulties lie.
PIN开关是一种广泛采用的微波半导体控制器件，高频、宽带、多掷一直是其设计难点所在。
The sensitivity for the semiconductor minority carrier lifetime measurement system was determined using microwave photoconductance decay.
对微波光电导法测量半导体少数载流子寿命的测试系统进行灵敏度分析。
The failure of semiconductor due to high power microwave has been puzzling people for a long time.
在高功率微波作用下，半导体器件的失效问题一直困扰着人们。
We present an on-wafer measurement technique of semiconductor wafer using special coplanar microwave probes.
本文描述了使用共面微波探针的半导体芯片在片测试技术。
Many semiconductor devices discussed in the previous chapters can be operated in the microwave region.
前面几章讨论的许多半导体器件都可以在微波波段运行。
Recently, duce to the improvements of semiconductor power device technology's and dropping of costs, more and more solid state transmitters have been adopted by various microwave systems.
近年来，由于半导体功率器件工艺的进步和成本的降低，微波固态发射机越来越多地为各类微波系统所采用。
Continuous development of semiconductor device and manufacture technology leads to a persisting demand for miniaturization and performance enhancement of microwave circuits.
随着半导体器件性能和工艺水平的不断提升，高性能、小型化微波部件的研制开始受到人们越来越多的关注。
Continuous development of semiconductor device and manufacture technology leads to a persisting demand for miniaturization and performance enhancement of microwave circuits.
随着半导体器件性能和工艺水平的不断提升，高性能、小型化微波部件的研制开始受到人们越来越多的关注。
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