The automatic measurement system and the data processing method are discussed for microspot photocurrent spectrum and reflection spectrum of semiconductor optoelectronic devices.
叙述了为测量半导体光电器件的光电流谱和光反射谱所构成的自动测量系统及其数据处理方法。
The automatic measurement system and the data processing method are discussed for microspot photocurrent spectrum and reflection spectrum of semiconductor optoelectronic devices.
叙述了为测量半导体光电器件的光电流谱和光反射谱所构成的自动测量系统及其数据处理方法。
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