An optical micro-displacement measurement method based on elliptic spot and off-axis principle is proposed.

提出一种基于离轴法并采用椭圆光斑的光学微位移计量手段。

youdao

An optical micro-displacement measurement method based on elliptic spot and off-axis principle is proposed.

提出一种基于离轴法并采用椭圆光斑的光学微位移计量手段。

youdao