Also, American Systems will support integrated circuit design and testing for analog, digital and radio frequency applications.
另外，美国系统将支持集成电路设计和模拟测试，数字和射频应用。
During the testing of the integrated circuit (404), it communicates in the wafer test mode.
在集成电路(404)的测试过程中，它在晶片测试模式下通信。
In detail, the inventive methodology is based on the use of scan chains being implemented in the integrated circuit for production testing purposes.
具体地，本发明的方法基于实现在集成电路中用于产品测试目的的扫描链的使用。
Aiming at the mixed-signal circuit testing, an integrated built-in self test (BIST) architecture for testing on-chip high speed ADC was presented.
针对混合信号电路的测试问题，提出了一种内建自测试(BIST)结构，分析并给出了如何利用该结构来计算片上高速模数转换器(adc)的静态参数。
Aiming at the mixed-signal circuit testing, an integrated built-in self test (BIST) architecture for testing on-chip high speed ADC was presented.
针对混合信号电路的测试问题，提出了一种内建自测试(BIST)结构，分析并给出了如何利用该结构来计算片上高速模数转换器(adc)的静态参数。
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