• For high pin-count products, some cases were illustrated using common ground connection and separating the ESD tests to overcome the limitations on SB available leads.

    对于一些管脚芯片产品举例说明了一种共连接分组测试的方法,克服封装有管脚数量限制的局限性

    youdao

  • For high pin-count products, some cases were illustrated using common ground connection and separating the ESD tests to overcome the limitations on SB available leads.

    对于一些管脚芯片产品举例说明了一种共连接分组测试的方法,克服封装有管脚数量限制的局限性

    youdao

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