Based on the photoconductive method the Energy Gap Measuring Device for Semiconductor Material-Type DB-1 has been developed.
根据光电导方法，研制了DB - 1型半导体材料禁带宽度测试装置。
Based on the photoconductive method the Energy Gap Measuring Device for Semiconductor Material-Type DB-1 has been developed.
根据光电导方法，研制了DB - 1型半导体材料禁带宽度测试装置。
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