The equation of four probes method for resistivity measurement requires point contacts and a definite configuration of probes array.
测量电阻率的四探针法公式中，要求是点接触而且探针的排列有一定的形状。
The ratio of resistance change is tested using Four Probes Method. The average change reaches 103, and is near to 104 of the theory estimation.
四探针法测量了薄膜电性能，薄膜电阻率平均变化达到103，比理论上只相差一个数量级；
In this paper, a simple method to measure the specific contact resistance of metal-semiconductor ohmic contact is developed, using the probe heads of the inline four probes.
本文提出一种用直线四探针头测量金属-半导体欧姆接触接触电阻率的简捷方法。
In this paper, a simple method to measure the specific contact resistance of metal-semiconductor ohmic contact is developed, using the probe heads of the inline four probes.
本文提出一种用直线四探针头测量金属-半导体欧姆接触接触电阻率的简捷方法。
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