• During the method testing inside the class, the testing points are divided into four kinds and the installation of each probe function which matches the location is discussed.

    进行类内方法测试时,将测试点分为四种,并分别论述适用于每种测试点位置的探针函数的设置。

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  • In this paper, a simple method to measure the specific contact resistance of metal-semiconductor ohmic contact is developed, using the probe heads of the inline four probes.

    本文提出一种用直线四探针头测量金属-半导体欧姆接触接触电阻率的简捷方法。

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  • As with the four-point collinear probe method, a differential measurement may be required if the sample resistance is of the same magnitude as the isolation (meter common to ground) of the voltmeter.

    与四点同线探针法一样,如果样品电阻和电压表的绝缘电阻(电压表的公共端到地)是同一数量级的,就可能需要使用差分测量。

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  • The thin film TE material resistivity measurement system which is designed in the thesis bases on the principle of four-probe method and double pulse technology.

    本论文依据四探针法的基本原理并结合双脉冲技术,设计并制造适用于薄膜温差电材料的电阻率测试系统。

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  • The contact resistance between the composite plates and carbon paper were measured with a four-probe method.

    通过四电极法测量了复合板与碳纸间的接触电阻。

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  • The resistivity temperature curves of MgB2 wires were measured by standard four-probe method.

    采用标准四引线法测定了样品的电阻温度曲线。

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  • A new method for measuring sheet resistance of semiconductor using four-point probe has been developed.

    本文介绍用四探针技术测量半导体薄层电阻的新方案。

    youdao

  • A new method for measuring sheet resistance of semiconductor using four-point probe has been developed.

    本文介绍用四探针技术测量半导体薄层电阻的新方案。

    youdao

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