Force modulation atomic force microscope and linear scanning system of scanning electron microscope were carried out to analyze the microstructure of composite interface.
采用力调制原子力显微镜及扫描电镜的线扫描功能对复合材料界面相精细结构进行分析。
Force modulation atomic force microscope and linear scanning system of scanning electron microscope were carried out to analyze the microstructure of composite interface.
采用力调制原子力显微镜及扫描电镜的线扫描功能对复合材料界面相精细结构进行分析。
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