For a fixed set of test vectors, the overall test time can be minimized using the scan chain constructed with this method.
对于确定的测试向量集，用该方法构造的扫描链能使电路总的测试时间最少。
For a fixed set of test vectors, the overall test time can be minimized using the scan chain constructed by this method.
对于确定的测试向量集，用该方法构造的扫描链能使电路总的测试时间最少。
For a fixed set of test vectors, the overall test time can be minimized using the scan chain constructed by this method.
对于确定的测试向量集，用该方法构造的扫描链能使电路总的测试时间最少。
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