To create these images, the researchers used a field-emission electron microscope, or FEEM.
为了得到这些图像，研究人员用的是场发射电子显微镜(Field - emissionelectron microscope or FEEM)。
Field emission scanning electron microscope (FESEM) has been used to investigate the fine structure of Fe-based metal film interface and its cross-section.
采用场发射扫描电子显微镜(FESEM)，研究了铁基金属包膜界面及其断面的精细结构。
The crystal structure, morphology and luminescent properties of samples were analyzed by the X-ray diffraction, field emission scanning electron microscope and spectrofluorometer, respectively.
通过X射线粉末衍射仪、场发射扫描电子显微镜和荧光分光光度计分别表征样品的晶体结构、颗粒形貌和发光性能。
The structural changes of leaf surface in acclimatization and growth in field of in vitro plantlets of Sophora japonica were studied using scanning electron microscope.
用扫描电子显微镜观察了槐树试管苗在移栽驯化及大田生长过程中叶表面结构的变化。
A facility has been developed that can function as a low-energy electron point source (LEEPS) microscope or a field-emission microscope (FEM).
研制了一台集低能电子点源显微镜和场发射显微镜于一体的设备。
The microforms of diffusion joint were analyzed using field emission scanning electron microscope with an attached energy dispersive Xray analyzer.
利用场发射电镜、能谱仪等对接合区的界面和组织形貌进行了分析比较。
Nodular defects, which are in critical state of damage, are cross-sectioned by focusing on the ion beam and by imaging using a field emission scanning electron microscope.
采用聚焦离子束和场发射扫描电镜对处于临界破坏状态的节瘤缺陷做剖面分析和观察。
The effect of the inorganic ingredient of the paste on the microstructure of the platinum electrode was investigated by field emission scanning electron microscope.
利用场发射扫描电镜研究了浆料的无机成分对烧成的铂电极微结构的影响。
On the basis of field work, by means of observation of microscope and analysis of electron probe, this paper researches main sulfide minerals of the deposit at great length.
在野外调查基础上，通过显微镜下观察及电子探针分析，对矿区主要金属硫化物进行了细致研究。
A nanometer material stretching device in a scanning electron microscope driven by a piezoceramics plate belongs to the testing field of a nanometer material original position.
压电陶瓷片驱动的扫描电镜中纳米材料拉伸装置属于纳米材料原位测试领域。
A nanometer material stretching device in a scanning electron microscope driven by a piezoceramics plate belongs to the testing field of a nanometer material original position.
压电陶瓷片驱动的扫描电镜中纳米材料拉伸装置属于纳米材料原位测试领域。
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