Aim at the problem above, a method that USES extended defect pattern state machine to detect defects is given.

针对上述问题，本文提出了使用扩展的缺陷模式状态机进行缺陷检测的方法。

youdao

Aim at the problem above, a method that USES extended defect pattern state machine to detect defects is given.

针对上述问题，本文提出了使用扩展的缺陷模式状态机进行缺陷检测的方法。

youdao