The composition of the particles has been determined by X-ray diffraction (XRD) and energy dispersive X-ray spectroscopy (EDX).
这种颗粒的组成可以由x射线衍射(XRD)和x射线能量谱(EDX)检测。
The elementary composition of NiHCF films in reduced and oxidized form were also characterized by energy dispersive X-ray spectroscopy (EDS).
并通过X射线能谱仪（EDS）分别测定了膜在氧化和还原状态下的元素组成。
The samples were characterized by field-emission scanning electron microscopy (SEM), energy dispersive X-ray spectroscopy(EDS) and photoluminescence (PL).
通过扫描电子显微镜（SEM）、能谱分析仪（EDS）和光致发光（PL）测试对样品进行了表征。
The microstructure and element distribution of the coating were investigated by scanning electric microscopy (SEM) and energy dispersive X-ray spectroscopy(EDS).
采用扫描电子显微镜（SEM）观察渗层表面、截面形貌，X射线能谱仪（EDS）检测渗层界面元素分布。
Energy dispersive X-ray spectroscopy(EDX) is a kind of analysis method used in researching the adhesive joint and polymer composite surface and interface characters.
EDX是一种研究粘接接头和聚合物基复合材料表界面性能的分析测试方法。
Suspended particulate matters in water environment collected from western Xiamen Bay were analyzed using scanning electron microscope(SEM) and energy dispersive X-ray spectroscopy(EDS).
利用扫描电子显微镜和X射线能谱仪对在厦门湾采集的水体悬浮颗粒物进行形态观察和X射线能谱微区元素分析。
The composition and microstructure of nanocomposite particles were analyzed by fourier transform infrared spectroscopy, energy dispersive X-ray spectroscopy, and scanning electron microscope.
通过X射线能谱仪、扫描电镜与傅立叶变换红外光谱研究纳米颗粒的组成及其微观结构；
The elementary composition of PANI-SnP composite films in reduced and oxidized form were also characterized by energy dispersive X-ray spectroscopy (EDS) and X-ray photoelectron spectroscopy (XPS).
通过X射线能谱仪（EDS）和X射线光电子能谱（XPS）分别测定了复合膜在氧化和还原状态下的元素组成。
The application of X-ray energy dispersive spectroscopy(EDS) is widespread in materials research.
X射线能量色散谱（EDS）分析方法在材料领域得到了广泛的应用。
The prepared powders and the green and sintered hollow-fiber membranes were characterized by thermal analysis, X-ray diffraction, scanning electron microscopy and X-ray energy dispersive spectroscopy.
用热分析、X射线衍射仪、扫描电镜、X射线能谱等技术对制备的粉体、烧结前后的中空纤维膜进行了表征。
The microstructure evolution along the cross section of the dissimilar joint was analyzed with the scanning electron microscopy (SEM) and X-ray energy dispersive spectroscopy (XEDS) method.
采用扫描电镜(sem)及能谱分析(XEDS)等方法对接头横截面的微观组织进行分析。
The microstructure evolution along the cross section of the dissimilar joint was analyzed with the scanning electron microscopy (SEM) and X-ray energy dispersive spectroscopy (XEDS) method.
采用扫描电镜(sem)及能谱分析(XEDS)等方法对接头横截面的微观组织进行分析。
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