This testing system is adopted to debug and test the VME modules in the electronic system of BES III(Beijing Spectrometer III), improving the efficiency of electronic hardware development and .
在BESIII的电子学系统VME机箱和插件级设备的调试和检测中采用了该测试系统，提高了硬件研制及调试的效率。
This testing system is adopted to debug and test the VME modules in the electronic system of BES III(Beijing Spectrometer III), improving the efficiency of electronic hardware development and .
在BESIII的电子学系统VME机箱和插件级设备的调试和检测中采用了该测试系统，提高了硬件研制及调试的效率。
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