Chip behaviors were analyzed using scanning electron microscope(SEM), to study the effects of applied load, scan cycles and scanning direction on nanomachining of Al and Cu samples.
应用光学显微镜和扫描电子显微镜对加福煤粉燃烧过程中微观形态的变化规律进行了详细的观察。
The fatigue fracture surfaces of multiaxial fatigue specimens subjected to proportional and non-proportional multiaxial loadings were observed and analyzed by using the scan electron microscope.
利用扫描电镜对多轴比例和非比例加载下的薄壁管多轴疲劳试样的断口表面进行扫描观测分析。
Two troubles in the operation of S-520 scan electron microscope are analyzed and the related circuits are described. The curing methods are explained in detail.
介绍了S-520型扫描电镜实际操作中出现的两种故障现象。对相关电路进行了简要分析。详细说明了故障的排除方法。
The micronized starch granular was analyzed and compared through Scan Electron Microscope.
利用扫描电子显微镜对微细化淀粉的颗粒形貌进行了分析比较。
The micronized starch granular was analyzed and compared through Scan Electron Microscope.
利用扫描电子显微镜对微细化淀粉的颗粒形貌进行了分析比较。
应用推荐