In this paper, the principle of electron beam write wafer is discussed briefly distinguish topography mark, and make the technology of wafer mark which is found by the electron beam exposure system.
本文扼要介绍了电子束直写圆片的原理,地形标记的识别,以及电子束曝光系统能识别的圆片标记的制造技术。
In this paper, the principle of electron beam write wafer is discussed briefly distinguish topography mark, and make the technology of wafer mark which is found by the electron beam exposure system.
本文扼要介绍了电子束直写圆片的原理,地形标记的识别,以及电子束曝光系统能识别的圆片标记的制造技术。
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