At the same instant, Q3 sources current into R4 through D1, thereby pulling the voltage on R4 to a diode drop below the supply voltage.
与此同时，Q3的源电流通过D1流到R4，从而拉动R4的电压，使二极管电压降到低于电源。
To avoid imprecise voltage control due to varying diode drop, the sample is taken from the battery side, even if this means a very small power waste.
以避免由于不同的二极管的压降的不精确电压控制，样品取自在电池的一侧，即使这意味着一个非常小的电力浪费。
The Source-Measure Unit can also test other diode parameters, including forward voltage drop and breakdown voltage.
源-测量单元还可以测量其它的二极管参数，包括正向电压降和击穿电压。
Measure the reverse breakdown voltage by sourcing a specified re verse current bias, then measuring the voltage drop across the diode.
通过施加规定的反向偏流，然后测量二极管两端的电压，即可测得反向偏置电流。
In order to observe the phenomenon of the filament temperature drop caused by the board-current, the ideal diode filament temperature was detected precisely with an infrared thermometer.
为了观察由板流引起的灯丝温度下降现象，利用红外测温仪对理想二极管灯丝温度作了精密测量。
In this circuit, some measures are adopted, such as making constant current source as a rectifying load. It makes the voltage drop of the rectifying diode maintain a constance.
该电路采取以恒流源为整流负载等有关措施，使整流二极管的正向导通压降为一常数。
In this paper, integral diode solar cell array for space use are presented. The forward voltage drop of the diode is related to its area and the rule of thumb equations are - given.
本文报道了空间太阳电池方阵中使用的整体二极管太阳电池，其二极管的正向压降与面积有关，并可由半经验公式表示。
The VF test is performed by sourcing a known current and measuring the resulting voltage drop across the diode.
VF测试需要提供一个已知的电流然后测量二极管上产生的电压降。
The VF test is performed by sourcing a known current and measuring the resulting voltage drop across the diode.
VF测试需要提供一个已知的电流然后测量二极管上产生的电压降。
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