The crystal structure was determined with four-circle diffractometer.
用四圆衍射仪测定了晶体结构。
The products after ignition were examined through X-ray diffractometer.
用X衍射仪测定了点火后的生成物。
The crystalline property of granular resistant starch(RS) was studied by X-ray diffractometer.
采用X-射线衍射仪对颗粒态抗性淀粉的结晶性质进行了研究。
It was characterized by optical microscope, SEM, IR, DSC and X-rays diffractometer respectively.
采用光学显微镜、SEM、IR、DSC和X射线衍射等多种手段对其进行表征。
The Principle of X-ray diffractometer method of macrostress measurement is described in this Paper.
本文叙述了使用X射线衍射仪法测量宏观应力的原理。
The copolymer was confirmed by means of Infrared spectroscopy, Microscope and X-ray diffractometer.
利用红外光谱、显微镜和X -射线衍射等手段对产物进行了结构和性能表征。
The microstructure of the coating is analysed with metallographic microscope and X ray diffractometer.
用金相显微镜和X射线衍射仪分析涂层的显微组织。
Result for X-ray diffractometer test indicates that no oxidization occurred during the spraying process.
射线衍射分析结果表明冷喷涂过程中，无氧化现象发生。
The products were well-characterized by X-ray diffractometer (XRD) and scanning electron microscope (SEM).
所得产物用X射线衍射仪(XRD)和扫描电子显微镜(SEM)进行了表征。
The implanted samples were analyzed using X ray diffractometer (XRD) and X ray photoelectron spectrometer (XPS).
注入后的样品用X射线衍射方法(XRD)以及光电子能谱方法(XPS)进行分析。
The crystal structure of the partly deuterized triglycine sulfate was studied by four-circle neutron diffractometer.
用中子四圆衍射仪测量了部分氚化的硫酸三甘氨酸的晶体结构。
The product of FSP is characterized by transmission electron microscopy (TEM) and X-ray powder diffractometer (XRD).
通过透射电镜(tem)和x -射线衍射仪(XRD)对所得片状银粉产物进行了表征。
The phase and the microstructure of the products were analysed by X-ray diffractometer and scanning electron microscope.
使用X射线衍射仪分析了产物的相结构，采用扫描电子显微镜观察了粉体颗粒形貌。
The crystal structures of bastnaesite-(Ce) and fluocerite-(Ce) was refined by high power four-circle X-ray diffractometer.
用强功率四圆单晶衍射仪精确地修正了氟碳铈矿和氟铈矿的晶体结构。
The microstructures and compositions of the composites were analyzed by scanning electron microscopy and X-ray diffractometer.
利用扫描电镜和X射线衍射仪分析了复合材料微观结构和组成成分的变化。
A part of the simulation and optimization results on the Neutron Diffractometer for Strain Measurements is introduced in this paper.
本文报道了应力测量专用中子衍射谱仪的部分模拟和优化工作。
The mesomorphic behavior of these polymers was characterized by a polarizing microscope, a DSC instrument and a X-ray diffractometer.
共聚物的液晶性用偏光显微镜、DSC和X射线衍射进行了表征。
The product was analyzed by using X-ray diffractometer and electronic microscope and the dispersity in organic solvents was determined.
对产品进行了X-射线衍射和电镜分析，并检测了在有机溶剂中的分散性。
The crystal structure and average size of the nanometer CaCOs particles have been tested by rotatory anode harrow X-ray diffractometer.
使用旋转阳极靶多晶X射线衍射仪测定其晶体结构和平均粒径大小。
Five crystal structures are determined by CCD diffractometer after the single crystals were grown by slow evaporation at room temperature.
用溶剂自然挥发法培养了五个单晶，并采用CCD 单晶衍射仪测定了它们的晶体结构。
METHODS: Study on the microstructure of Indigo Naturals with scanning electron microscope (SEM) and X ray diffractometer (XRD) were carried out.
方法：通过扫描电子显微镜(sem)和x衍射(XRD)方法，对青黛的微观结构进行了研究。
The liquid crystalline behavior of the copolymers was characterized by DSC, polarizing microscopy with a heating stage and X ray diffractometer.
聚合物的液晶行为用DSC、偏光显微镜和X射线衍射进行了表征，发现单体有热致液晶性；
Double crystal diffractometer applied to measure SAXS is very satisfactory, since it has high resolving power and relatively small measure area.
双晶衍射仪的分辨本领高，测量范围小，最适合作小角散射测量。
The tungsten oxide films by two methods were characterized by atomic force microscope, double-beam UV-VIS-NIR spectrophotometer and X-diffractometer.
本文分别用原子力显微镜、双束紫外可见分光光度计、X-衍射仪等表征了用以上两种方法制备的三氧化钨薄膜。
Analysis and removal of the troubles in cooling water system of VD_1A X_ray diffractometer were introduced in this paper with an example demonstration.
介绍了岛津vd_1a型X射线衍射仪冷却循环水系统的故障分析及排除方法。
The microstructure of the alloy as well as morphology and distribution of carbides were examined by using light microscope, SEM and X-ray diffractometer.
采用光学显微镜，扫描电子显微镜及X光衍射研究了合金的显微组织、碳化物形态及分布。
The hardness gradient, depth, microstructure and phases of nitrided layers were measured with Microhardness Apparatus, Microcopy and X-ray diffractometer.
利用显微硬度计、金相显微镜和X射线衍射仪测定了渗氮层的硬度梯度、层深、显微组织和相组成。
The structural properties of the films were analyzed by X ray photo electron spectroscopy (XPS), X ray diffractometer (XRD) and atomic force microscope (AFM).
使用X射线光电子能谱仪(XPS)、X射线衍射仪(XRD)、原子力显微镜(afm)对薄膜的结构进行了分析。
In this paper, a micro-computerized upgrading method for old model X-ray diffractometer, as well as its data collection and analysis system (XRDS) are recommended.
介绍一种旧型号的X射线衍射仪微机化的升级改造技术以及相应的数据采集与分析系统(XRDS)。
The morphology, composition and structure of the coating were investigated by scanning electron microscopy, energy dispersive spectrometer and X-ray diffractometer.
用扫描电镜、能谱仪和X射线衍射仪分别分析了涂层的形貌、化学成分和相组成。
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