Finally, a miniature test structure for RF device characterization and process monitoring is also proposed.
最后，一通用于射频元件特性分析与制程监测的微型化测试结构亦被提出。
We briefly summarize the applications of PEEM to areas such as surface structure analysis, surface chemistry, magnetism, and semiconductor device characterization.
简要总结光电子显微术在表面结构分析，表面化学，磁学，以及半导体器件表征等方面的应用。
We briefly summarize the applications of PEEM to areas such as surface structure analysis, surface chemistry, magnetism, and semiconductor device characterization.
简要总结光电子显微术在表面结构分析，表面化学，磁学，以及半导体器件表征等方面的应用。
应用推荐