Finally, a miniature test structure for RF device characterization and process monitoring is also proposed.
最后，一通用于射频元件特性分析与制程监测的微型化测试结构亦被提出。
For example, in optical spectroscopy, a correct intensity measurement of the probe beam is fundamental during material and device characterization.
例如，在光谱学中，探测器光柱的正确亮度测量是材料和设备描述的基础。
We briefly summarize the applications of PEEM to areas such as surface structure analysis, surface chemistry, magnetism, and semiconductor device characterization.
简要总结光电子显微术在表面结构分析，表面化学，磁学，以及半导体器件表征等方面的应用。
The significance of this device is discussed with regard to its functions in characterization and in deepening the themes.
本文从多个层面分析了这种对比与共鸣的构成，探讨其在丰富人物形象和深化主题思想方面的意义。
The problems related to material structure, device processing as well as performance characterization also have been discussed.
文中对其材料结构、器件工艺制作以及性能测量表征等方面的问题进行了讨论。
The problems related to material structure, device processing as well as performance characterization also have been discussed.
文中对其材料结构、器件工艺制作以及性能测量表征等方面的问题进行了讨论。
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