The test generation algorithm for non-robust path delay fault in combinational circuits is studied.
研究了组合电路中非鲁棒性路径时滞故障的测试生成算法。
The experiments indicate that functional test sets may be able to identify functions whose realizations have low path delay fault coverage.
实验表明，这种功能测试集具有实现低路径延迟故障覆盖范围的功能。
This paper proposes a new algorithm for transient current test (IDDT) generation for delay fault.
这里提出了一种关于延时故障的测试产生算法。
This paper propose a functional fault for delay faults in combinational circuits and describe a functional test generation procedure based on this model.
提出一种用于测试组合电路中延迟故障的新功能故障模型，讨论该模型的功能测试生成。
Finally, a new test scheme to detect the crosstalk fault, based on the path delay inertia, for interconnection lines in SoC is proposed.
最后，我们提出一个利用路径延迟惯性原理，来测试系统电路连线之串音障碍的新测试方法。
Finally, a new test scheme to detect the crosstalk fault, based on the path delay inertia, for interconnection lines in SoC is proposed.
最后，我们提出一个利用路径延迟惯性原理，来测试系统电路连线之串音障碍的新测试方法。
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