• The circuit also includes a second subcircuit that causes a second transistor (25) that is coupled to the circuit's output (34) to turn on during a falling transition and then turn off.

    该电路还包括第二分支电路,该第二分支电路使得耦合到该电路的输出(34)的第二晶体管(25)在下降跃迁期间导通并接着被断开。

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  • The first switch circuit is coupled to the electrical level translator and turns off the fourth transistor when the third transistor is turned on.

    第一开关电路耦 接至电平转换器,并在第三晶体管导通时,关闭第四晶体管。

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  • While the second switch circuit is coupled to the electrical level translator and turns off the second transistor when the first transistor is turned on.

    而第二开关电路耦接至电平转换器,并在第一晶体管导通时,关闭第二晶体管。

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  • The circuit includes a first subcircuit that causes a first transistor (16) that is coupled to the circuit's output (34) to turn on during a rising transition and then turn off.

    该电路包括第一分 支电路,该第一分支电路使得耦合到该电路的输出(34)的第一晶 体管(16)在上升跃迁期间导通并接着断开。

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  • An access transistor (54) is coupled between each storage node (SN, SNB) and a write bit line (WWB0) and controlled by a write word line (WWL0).

    存取晶体管(54)耦合在每个存储节点(SN,snb)和写入位线(WWB0)之间,并且由写入字线(WWL0)控制。

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  • The sleep transistor circuitry is coupled to the first circuitry and receives a sleep signal that has a negative voltage.

    该休眠晶体管电路连接至该第一电路并接收具有负电压的休眠信号。

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  • When these switch components are composed of a thin film transistor, the testing device at least includes a switch wiring coupled to the gates of the thin film transistor.

    当开关组件是由薄膜晶体管所构成时,测试装置更包括至少一开关配线,电性耦接至薄膜晶体管的闸极。

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  • First and second resistors are coupled in series between the electrode and the second transistor.

    第一和第二电阻器串联在所述电极和第二晶体管之间。

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  • First and second resistors are coupled in series between the electrode and the second transistor.

    第一和第二电阻器串联在所述电极和第二晶体管之间。

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